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Radiation-hardness components at scaled technology nodes – test of single-events effects in ARM Cores (ARIADNA)

The main goal of this Ariadna study was to determine the radiation hardness of potential future space processors. The AR0 test-chip was used to study the impact of SEUs and SETs on different versions of a hardened processor on UTBB-FDSOI 28nm technology, including DICE flip-flops, and three different hardening level of combinational logic.

Canada

15R4

University of...

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