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Use of the Novel Modelocked Semiconductor Lasers technique in the Sub-Picosecond Regime for Space Missions

Programme
TDE
Programme Reference
T716-069MM
Prime Contractor
CSEM SA. Centre Suisse dElectronique et de Microtechnique SA
Start Date
End Date
Status
Closed
Country
Switzerland
Objectives

The present activity addresses the applications of sub-picosecond Mode-Locked-Semiconductor Lasers-based new metrology concepts for (future) space missions such optical interferometry and metrology missions, spectroscopy, optical communications, on-board data processing, etc, and assess the impact at overall performance and system level.

Description

The novel technology of Modelocked Semiconductor Lasers (MLSCL) is a promising candidate to be used in optical metrology systems for various space applications, e.g. in the context of optical interferometry or frequency and distance metrology as well as optical communications and data processing. Recent laboratory demonstrations of MLSCLs are capable of producing VIS / NIR ultrashort light pulses in the few picoseconds time regime at very high repetition rates in the MHz domain. These ultrashort light signals can be used in a simple time-of-flight (TOF) metrology system for the measurement of short and - limited by the achievable optical output power - also long distances of potentially kilometres with an accuracy on the millimetre level. Due to the MLSCLs compactness and superior wall plug efficiency they could be integrated into miniature optical systems replacing presently used laser light sources of large unit dimension. The present activity addresses the development and performance characterisation of MLSCLs in the sub-picosecond time domain investigating the suitability for space applications.

Application Domain
Generic Technologies
Technology Domain
17 - Optoelectronics
Competence Domain
1-EEE Components, Photonics, MEMS
Keywords
17-Optoelectronics
Initial TRL
TRL 1
Target TRL
TRL 3
Achieved TRL
TRL 3
Public Document
Executive Summary